Modelling drop-drop interactions in an atomic force microscope
نویسندگان
چکیده
منابع مشابه
Drop retention force as a function of drop size.
The force, f, required to slide a drop past a surface is often considered in the literature as linear with the drop width, w, so that f/w = const. Furthermore, according to the Dussan equation for the case that the advancing and receding contact angles are constant with drop size, one can further simplify the above proportionality to f/V(1/3) = const where V is the drop volume. We show, however...
متن کاملForce Spectroscopy with the Atomic Force Microscope
Introduction and Review Atomic Force Microscope (AFM) Spectroscopy is an AFM based technique to measure, and sometimes control the polarity and strength of the interaction between the AFM tip and the sample. Although the tip-sample interaction may be studied in terms of the energy, the quantity that is measured first is always the tip-sample force, and thus the nomenclature: force spectroscopy....
متن کاملForce-feedback High-speed Atomic Force Microscope
High-speed atomic force microscopy (HSAFM) has enabled researchers to view the nanometer-scale dynamic behavior of individual biological and bio-relevant molecules at a molecular-level resolution under physiologically relevant time scales, which is the realization of a dream in life sciences. These high-speed imaging applications now extend to the cellular/bacterial systems with the use of a sm...
متن کاملScanned-cantilever atomic force microscope
We have developed a 3.6 pm scan range atomic force microscope that scans the cantilever instead of the sample, while the optical-lever detection apparatus remains stationary. The design permits simpler, more adaptable sample mounting, and generally improves ease of use. Software workarounds alleviate the minor effects of spurious signal variations that arise as a result of scanning the cantilev...
متن کاملPrint your atomic force microscope.
Progress in scanning probe microscopy profited from a flourishing multitude of new instrument designs, which lead to novel imaging modes and as a consequence to innovative microscopes. Often these designs were hampered by the restrictions, which conventional milling techniques impose. Modern rapid prototyping techniques, where layer by layer is added to the growing piece either by light driven ...
متن کاملذخیره در منابع من
با ذخیره ی این منبع در منابع من، دسترسی به آن را برای استفاده های بعدی آسان تر کنید
ژورنال
عنوان ژورنال: ANZIAM Journal
سال: 2005
ISSN: 1445-8810
DOI: 10.21914/anziamj.v46i0.991